JG

Jinde Gao

SC Shanghai Huali Integrated Circuit: 1 patents #4 of 52Top 8%
Overall (2025): #345,305 of 469,880Top 75%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12339202 Method of failure analysis for defect locations Qiang Chen 2025-06-24