CW

Chengchang Wei

SC Shanghai Huali Integrated Circuit: 1 patents #4 of 52Top 8%
Overall (2025): #420,916 of 469,880Top 90%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12276920 Method for avoiding damage to overlay metrology mark — 2025-04-15