Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347497 | NAND early erase termination based on leakage current test | Yuanyuan Wu, Xiaochen Zhu, Lito De La Rama, Suanbin Loh | 2025-07-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347497 | NAND early erase termination based on leakage current test | Yuanyuan Wu, Xiaochen Zhu, Lito De La Rama, Suanbin Loh | 2025-07-01 |