Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412771 | Methods of detecting process deviations during microelectronic device fabrication and associated tapes and components | Ankur Shah, Venkateswarlu Bhavanasi, Wen How Sim | 2025-09-09 |