Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12307651 | Method of detecting measurement error of SEM equipment and method of aligning SEM equipment | Nohong KWAK, Donyun Kim, Yunhyoung Nam, Kihyun Kim | 2025-05-20 |
| 12229944 | Defect detection method of deep learning-based semiconductor device and semiconductor element manufacturing method including the defect detection method | Kyenhee Lee, Sooryong Lee | 2025-02-18 |