Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379328 | Inspection system and inspection method for semiconductor device | Wookjin Lee | 2025-08-05 |
| 12265778 | Method of detecting defective layer of semiconductor device and computing system for performing the same | Junghwan Kim, Insu JANG, Hyeonhwa Jang | 2025-04-01 |