Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12375815 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Mark Uebel, Alan Philip Franks +1 more | 2025-07-29 |
| 12284445 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Mark Uebel, Alan Philip Franks +5 more | 2025-04-22 |