Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12229945 | Wafer bin map based root cause analysis | Tomonori Honda, Lin Lee Cheong, Richard Burch, Jeffrey Drue David, Michael Keleher | 2025-02-18 |
| 12223012 | Machine learning variable selection and root cause discovery by cumulative prediction | Richard Burch, Jonathan E. Holt, Tomonori Honda | 2025-02-11 |