Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399195 | Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same method | Seung Hun BAIK, Seonghun Yun, Byoung-Woon Ahn, Sang-Il Park | 2025-08-26 |