YH

Yuki Hanzawa

OM Omron: 1 patents #119 of 361Top 35%
Overall (2025): #157,227 of 469,880Top 35%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12217411 Inspection apparatus, unit selection apparatus, inspection method, and computer-readable storage medium storing an inspection program Masashi Kurita, Sakon Yamamoto, Yuki Hasegawa, Shigenori NAGAE, Yutaka Kato 2025-02-04