AT

Akira Tsuji

NE Nec: 10 patents #14 of 917Top 2%
Overall (2025): #6,571 of 469,880Top 2%
10
Patents 2025

Issued Patents 2025

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
12372351 Abnormality detection system, abnormality detection method, and computer readable medium 2025-07-29
12359908 Member distinguish apparatus, member distinguish method, and computer-readable medium 2025-07-15
12352859 Position management device, position management system, position management method and non-transitory computer-readable medium having program stored thereon 2025-07-08
12345820 Measurement control apparatus, measurement system, measurement control method, and non-transitory computer readable medium 2025-07-01
12339367 Detection device, determination method, and non-transitory computer-readable medium Yoshimasa Ono, Junichi Abe, Jiro Abe 2025-06-24
12270766 Inspection support apparatus, inspection support method, and computer-readable medium 2025-04-08
12222293 Detection device, label assignment method, and non-transitory computer-readable medium Junichi Abe, Taisuke Tanabe 2025-02-11
12223634 Inspection apparatus, measuring method, and computer readable medium for acquiring point cloud data of good quality in performing measurement of a member to be inspected using a three-dimensional sensor 2025-02-11
12217482 Processing apparatus, processing method, and computer readable medium Yoshimasa Ono, Junichi Abe 2025-02-04
12204030 Detection apparatus, determination method, and non-transitory computer readable medium storing program 2025-01-21