Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379402 | Magnetic probe-based current measurement device, and measurement method | Pin QU, Songsheng Xue, Huijuan Wang | 2025-08-05 |
| 12326434 | Method for quantitatively characterizing dendrite segregation and dendrite spacing of high-temperature alloy ingot | Dongling Li, Haizhou Wang, Xuejing Shen, Lei Zhao, Wenyi Cai +2 more | 2025-06-10 |