Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12315696 | Device for observing permeation and diffusion path of observation target gas, observation target gas measuring method, point-defect location detecting device, point-defect location detecting method, and observation samples | Akiko Nakamura, Yoshiharu Murase, Hideaki Nishikawa, Naoya Miyauchi | 2025-05-27 |