Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386271 | Multi-layer calibration for empirical overlay measurement | Nigel P. Smith, Francis Scott Hoover, Nicholas James Keller | 2025-08-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386271 | Multi-layer calibration for empirical overlay measurement | Nigel P. Smith, Francis Scott Hoover, Nicholas James Keller | 2025-08-12 |