Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211570 | Test circuit and method for reading data from a memory device during memory dump | Li Deng, Ying-Yen Chen | 2025-01-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211570 | Test circuit and method for reading data from a memory device during memory dump | Li Deng, Ying-Yen Chen | 2025-01-28 |