Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12230546 | Wafer registration and overlay measurement systems and related methods | Nikolay A. Mirin, Richard T. Housley, Xiaosong Zhang, Jonathan D. Harms, Stephen J. Kramer | 2025-02-18 |
RD
Robert Dembi
Overall (2025): #238,954 of 469,880Top 55%
1
Patents 2025