Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12236576 | Workpiece surface defect detection device and detection method, workpiece surface inspection system, and program | Akira Yahashi, Yoshihito Souma, Taizo Wakimura, Ryuichi Yoshida | 2025-02-25 |