Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12288725 | Critical dimension error analysis method | Xueru YU, Hongxia SUN, Chen Li, Pengfei Wang, Jiebin Duan +6 more | 2025-04-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12288725 | Critical dimension error analysis method | Xueru YU, Hongxia SUN, Chen Li, Pengfei Wang, Jiebin Duan +6 more | 2025-04-29 |