Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12298254 | System and method for reducing sample noise using selective markers | Grace Hsiu-Ling Chen, Martin Gruebele | 2025-05-13 |
| 12211196 | Ensemble of deep learning models for defect review in high volume manufacturing | Vera Andreeva, Lawrence P. Muray | 2025-01-28 |