Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347706 | Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein | Roie Volkovich, Renan Milo, Liran Yerushalmi, Moran Zaberchik, David Izraeli | 2025-07-01 |
| 12204254 | Multi-layered moiré targets and methods for using the same in measuring misregistration of semiconductor devices | Mark Ghinovker | 2025-01-21 |