Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12380367 | Metrology in the presence of CMOS under array (CuA) structures utilizing machine learning and physical modeling | Houssam Chouaib, Zhaxylyk Kudyshev, Chao Chang | 2025-08-05 |
| 12372882 | Metrology in the presence of CMOS under array (CUA) structures utilizing an effective medium model with classification of CUA structures | Zhaxylyk Kudyshev, Chao Chang, Houssam Chouaib | 2025-07-29 |