Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12235770 | Failure analysis system of semiconductor device, failure analysis method of semiconductor device, and non-transitory computer readable medium | Yoshikazu Iizuka, Masahiro Noguchi, Yumiko Watanabe | 2025-02-25 |