Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422381 | Optical inspection method and storage medium, and optical inspection apparatus that uses the same | Hiroshi Ohno, Hideaki Okano, Kenta TAKANASHI, Takahiro Kamikawa | 2025-09-23 |
| 12379323 | Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus | Hiroshi Ohno, Hideaki Okano | 2025-08-05 |
| 12366526 | Optical test apparatus and optical test method | Hiroshi Ohno, Hideaki Okano | 2025-07-22 |
| 12188876 | Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus | Hiroshi Ohno, Takahiro Kamikawa, Hideaki Okano, Akifumi Ohno, Akio Kawasaki +1 more | 2025-01-07 |