Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354827 | Aberration correcting device and electron microscope | Hidetaka Sawada | 2025-07-08 |
| 12255041 | Electron microscope and method of correcting aberration | Keito Aibara, Tomohiro Nakamichi, Motofumi Saito, Ryusuke Sagawa, Fuminori Uematsu | 2025-03-18 |