Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12359945 | Measurement system and method of use | Todd M Dunford, Scott Denenberg, Kevin P Dixon, Yanko K. Sheiretov, Saber Bahranifard +2 more | 2025-07-15 |
| 12332201 | System and method for pit detection and sizing | Andrew P. Washabaugh, Mark Windoloski | 2025-06-17 |
| 12253492 | In-process quality assessment for additive manufacturing | Todd M Dunford | 2025-03-18 |