Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12210057 | Wafer-level test method for optoelectronic chips | Christian KARRAS, Tobias Gnausch, Robert BUETTNER, Kay Reetz, Armin Grundmann | 2025-01-28 |
| 12203983 | Contacting module for contacting optoelectronic chips | Robert BUETTNER, Armin Grundmann, Tobias Gnausch, Stefan Franz, Christian KARRAS | 2025-01-21 |