HS

Hirokazu Seki

JD Japan Display: 1 patents #140 of 260Top 55%
LA Lasertec: 1 patents #2 of 6Top 35%
Overall (2025): #121,925 of 469,880Top 30%
2
Patents 2025

Issued Patents 2025

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12361536 EUV mask inspection device, EUV mask inspection method, non-transitory computer-readable medium storing EUV mask inspection program, and EUV mask inspection system including a gray image based on design data of a pattern Yoshihiro Kato 2025-07-15
12353099 Display device 2025-07-08