Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405248 | Eddy current flaw detection system based on NV color center quantum sensing technology and detection method thereof | Bowen Zhao, Peng Wang, Dacheng Luo, Zhen Zhang, Xin Peng Liu | 2025-09-02 |