Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347083 | Area selection in charged particle microscope imaging | Holger Kohr, Maurice Peemen | 2025-07-01 |
| 12327342 | Automatic particle beam focusing | Erik Franken, Bart van Knippenberg, Holger Kohr | 2025-06-10 |
| 12216068 | Bifocal electron microscope | Alexander Henstra, Holger Kohr | 2025-02-04 |