Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12278940 | Automated inspection data collection for machine learning applications | Raf Peeters, Antoon De Cleen, Pieter Ieven | 2025-04-15 |
| 12278941 | Automated sample weight measurement via optical inspection | Raf Peeters, Antoon De Cleen, Pieter Ieven | 2025-04-15 |
| 12219117 | Automated sample weight measurement via optical inspection | Raf Peeters, Antoon De Cleen, Pieter Ieven | 2025-02-04 |