Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379395 | Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test | Choon-Beng Sia, Yoichi Funatoko, Isao Kunioka, Masanori Watanabe, Ken Dawson | 2025-08-05 |