Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320830 | Method, device and system for measuring frequency domain characteristics, and storage medium | Yaqi Fang, Jianbin Liu | 2025-06-03 |
| 12222389 | Test board for testing memory signal | Honglong SHI | 2025-02-11 |