Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12402380 | Nondestructive characterization for crystalline wafers | Robert Tyler Leonard, Edward Robert Van Brunt | 2025-08-26 |
| 12322087 | Multi-scale autoencoders for semiconductor workpiece understanding | Edward Robert Van Brunt | 2025-06-03 |