Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12247927 | Method of evaluating semiconductor wafer | Motoi Kurokami | 2025-03-11 |
| 12188880 | Method of calibrating coordinate position identification accuracy of laser surface inspection apparatus and method of evaluating semiconductor wafer | Takahiro NAGASAWA | 2025-01-07 |