Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400319 | Defect examination on a semiconductor specimen | Yehonatan Hai Ofir, Yehonatan Ridelman, Ran BADANES, Boris Sherman | 2025-08-26 |
| 12361531 | Machine learning-based classification of defects in a semiconductor specimen | Ohad Shaubi, Kirill Savchenko, Ore SHTALRID | 2025-07-15 |