Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265776 | Identifying test coverage gaps for integrated circuit designs based on node testability and physical design data | Kapil Narula, Rahul Kalyan, Hongkun Liang | 2025-04-01 |
| 12237217 | Methods of exposing conductive Vias of semiconductor devices and related semiconductor devices | Hongqi Li, Irina Vasilyeva | 2025-02-25 |