Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283039 | Method and system for defect inspection based on deep learning | Tae Hyun Kim, Hye-rin Kim | 2025-04-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283039 | Method and system for defect inspection based on deep learning | Tae Hyun Kim, Hye-rin Kim | 2025-04-22 |