Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12248391 | Defect analysis apparatus, program, and defect analysis method | Yasufumi Suzuki | 2025-03-11 |
| 12248769 | Program analyzing apparatus, program analyzing method, and trace processing addition apparatus | Hiroto Kaga, Yasufumi Suzuki | 2025-03-11 |