Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12198894 | Measurement system and method of setting parameter of charged particle beam device | Hiroshi Oinuma, Kazuki Ikeda, Wen Li | 2025-01-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12198894 | Measurement system and method of setting parameter of charged particle beam device | Hiroshi Oinuma, Kazuki Ikeda, Wen Li | 2025-01-14 |