Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379207 | Measurement system for detecting deep-hole surface topography based on low-coherence interferometry | Huining Zhao, Xiaoying Hou, Jie Wang, Liandong Yu | 2025-08-05 |
| 12247856 | Micro-displacement measurement system having picometer scale resolution and measurement method | Fangfang LIU, Xinyang Liu, Wei Zhou, Xin RAN, Hongli Li | 2025-03-11 |