Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366541 | Sample holder for X-ray diffraction analysis and x-ray diffraction analysis method using the same | Yun Sung Kim, Yoon Kwang Lee, Ga Hyeon Im, Sang Heon Lee, Kyu Joon Lee +3 more | 2025-07-22 |