Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360056 | Semiconductor apparatus examination method and semiconductor apparatus examination apparatus | Tomochika Takeshima, Takafumi Higuchi | 2025-07-15 |
| 12211199 | Method for inspecting semiconductor and semiconductor inspecting device | Tomochika Takeshima, Takafumi Higuchi | 2025-01-28 |