YK

Yoshikazu Kitamura

NE Nec: 1 patents #472 of 917Top 55%
Overall (2025): #160,806 of 469,880Top 35%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12190519 Inspection device, inspection method and storage medium Tomoharu Kiyuna, Ikuma Takahashi, Maki Sano, Kenichi Kamijo, Kimiyasu Takoh 2025-01-07