Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12209853 | Non-contact apparatus for measuring wafer thickness | Chihiro Miyagawa, Kazutaka Shibuya | 2025-01-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12209853 | Non-contact apparatus for measuring wafer thickness | Chihiro Miyagawa, Kazutaka Shibuya | 2025-01-28 |