Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12230890 | Methods and measurement systems for precisely evaluating a device under test | Ramez ASKAR, Kei Sakaguchi, Thomas Haustein, Leszek RASCHKOWSKI | 2025-02-18 |
| 12231177 | Apparatus, measurement system and measurement setup and methods for testing an apparatus | Thomas Haustein, Ramez ASKAR, Leszek RASCHKOWSKI, Marcus GROßMANN, Markus Landmann | 2025-02-18 |