Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12313682 | Method, system and device of serializing and de-serializing the delivery of scan test data through chip I/O to reduce the scan test duration of an integrated circuit | Amit Wangoo, Zhanwei Zhong | 2025-05-27 |