Partial year: Data through Q3 2025 (Sept 30). Full-year totals not yet available.
AE

Andries Pieter Johan EFFTING

DB Delmic Ip B.V.: 2 patents #1 of 6Top 20%
📍 Delft, NL: #7 of 122 inventorsTop 6%
Overall (2025): #141,921 of 469,880Top 35%
2
Patents 2025

Issued Patents 2025

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12387905 Apparatus and method for detecting one or more scanning charged particle beams Lenard Maarten Voortman 2025-08-12
12306121 Method and apparatus for inspecting a sample by means of multiple charged particle beamlets Sander Vincent DEN HOEDT 2025-05-20