Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299909 | Method and apparatus for high resolution measurement of a workpiece | Jeffrey T. Drake, Russell Wayne Madara, Jay Katsuhiko Stearns, Eric Daniel Treacy, David John Worthey +1 more | 2025-05-13 |