Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406349 | Method and apparatus for detecting defect on surface of cell | Hongji Sun, Fei Chen | 2025-09-02 |
| 12374072 | Correction method and apparatus for depth image, and method for welding inspection of shell assembly of battery | Chao Yuan, Annan Shu | 2025-07-29 |
| 12307719 | Calibration scale, calibration method and apparatus, and detection method and apparatus | Guan-An Chen, Fei Chen | 2025-05-20 |
| 12266091 | Defect detection method and apparatus, and computer-readable storage medium | Zhiyu Wang, Xi Wang | 2025-04-01 |
| 12259718 | Debugging method and apparatus for production line devices and production line system | Jiwei Chen | 2025-03-25 |