Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12254941 | Test circuit, test method and memory | Jianyong Qin, Zhonglai LIU | 2025-03-18 |
| 12254943 | Signal detection system for duty cycle testing and memory detection method | Jianyong Qin, Zhonglai LIU | 2025-03-18 |
| 12231129 | Signal generator and memory | Jianyong Qin, Zhonglai LIU | 2025-02-18 |